News :
June 10 2013
IRT Nanoelec celebrates its first year
- Life @ MINATEC
- MINATEC
- News
- Research
The 17 Grenoble-based members of IRT Nanoelec will meet at MINATEC on June 24, 2013 to celebrate the research institute’s first anniversary. All seven of the planned R&D projects have been kicked off since the institute was created in April 2012, including projects on 3D integration and photonics on silicon—the system’s core technology. The project […] >>
June 10 2013
Grenoble Institute of Technology neck-and-neck with Polytechnique
- Education
- Life @ MINATEC
- News
Grenoble Institute of Technology came in second place in the latest ranking of France’s 100 top engineering schools, just behind rival Polytechnique. In terms of R&D, Grenoble Institute of Technology jumped from seventh place in 2012 to first place this year. The ranking is put together every year by L’Usine Nouvelle magazine. In 2013 the […] >>
June 10 2013
CEA, France’s second-largest patent filer in 2012
- Industry
- MINATEC
- News
- Research
France’s National Intellectual Property Institute (INPI) issued a list in April of France’s busiest patent fi lers in 2012. The CEA edged up to second place with 566 patent applications, up from 545 in 2011. This puts it just ahead of Safran with 556 applications and well behind leader PSA Peugeot Citroën with 1,348 applications. […] >>
June 10 2013
Aledia powers ahead at light(n)ing speed
- Industry
- MINATEC
- News
- Research
Aledia, a start-up spun off from Leti, has just crossed two important milestones. First, it has finished making its first series of LEDs on 200 mm silicon wafers—a breakthrough process that cuts LED production costs by a factor of four relative to conventional methods. And second, the young firm has raised €10 million of fresh […] >>
June 10 2013
MEIS looks at nanowire constraints
- MINATEC
- News
- Research
MEIS, or medium-energy ion scattering, off ers very-high-resolution chemical and structural surface analysis capabilities. The technique works by analyzing the energy and angle of backscattered ions, and is frequently used for fl at layers. A team of researchers from INAC and Leti recently came up with an innovation when they used MEIS to study the […] >>


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