IMEP-LAHC acquires new noise characterization equipment for advanced components

IMEP-LAHC recently purchased a 300 mm manual prober station with a high-quality Faraday cage. The equipment will be used to characterize the low-frequency noise (a few mHz to 10 kHz) of transistors and microelectronic components like photodiodes.

The Faraday cage offers much better electromagnetic isolation (especially from electrical wiring) than the dark boxes widely used in lab testing. The noise characterization tests will help researchers understand the properties of the faults at the interfaces of semiconductor devices and improve the fabrication processes used to make advanced components. The tests also inform the development of circuit simulation models.

The station will be available to other research teams via the FMNT OPE)N(RA platform.

Contact: mescot@minatec.inpg.fr

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