Nanocharacterization Platform combines four surface-microscopy techniques

The Nanocharacterization Platform (PFNC) has created a state-of-the art microscopy unit combining four surface-microscopy techniques. Samples are shuttled from one piece of equipment to another in a controlled atmosphere or under high vacuum, which means that researchers can conduct various tests—gleaning elementary, chemical, and structural information at scales ranging from the millimeter down to the nanometer—without exposing the samples to the ambient air.
The unit contains three electron spectroscopy (XPS and Auger) microscopes, two near-field (AFM and KFM) microscopes, and a time-of-flight secondary ion mass spectrometry (ToF-SIMS) microscope. The platform’s staff determines which techniques to use on a case-by-case basis.
Researchers can use the unit to examine materials for lithium batteries, organic and inorganic electronics, biosystems, and more.

Contact: olivier.renault@cea.fr

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