Nanocharacterization Platform gets micro Raman equipment

The Nanocharacterization Platform (PFNC) now has two micro Raman instruments for measuring the chemical, mechanical, structural, and electronic properties of thin-layer materials. The measurements, down to the nanometric scale, can be taken with or without prior sample preparation, either locally or by 2D or 3D mapping. The wavelengths available range from near UV to near IR for exploring various materials of different thicknesses.
The primary benefit of micro Raman equipment is speed. While interpreting the spectra is a complex task, the spectra themselves are obtained within just seconds or, at most, minutes. Over the past several months the equipment has been used to characterize semiconductor materials for PV, microelectronics, and lighting applications.

Contact: denis.rouchon@cea.fr

Facebook

Twitter