Nanocharacterization platform upgrades TEM equipment
Categorie(s) : MINATEC, News, Research
Published : 7 June 2017
Transmission electron microscopy (TEM) produces much more than just images. The TEM equipment at the CEA nanocharacterization platform (PFNC) provides detailed information on the chemistry of the materials analyzed. And, to make sure that the platform’s equipment stays at the international state of the art, two transmission electron microscopes have been upgraded with advanced analysis systems.
The first was equipped with spectrometers to provide information on the chemical composition of the materials analyzed as well as on the materials’ chemical bonds and optoelectronic properties down to the atomic scale. The second received a new ultra-fast CMOS camera to observe dynamic phenomena in samples. Applications for the upgraded equipment range from nanoscience to batteries, photovoltaics, microelectronics, and power electronics.
Contact: vincent.delaye@cea.fr