Determining Electron Wave Functions and Object Potentials in Transmission Electron Microscopy: application to stacks of 2D materials

Up to now transmission electron microscopy (TEM) was more focused on producing images or diffraction patterns of objects. Of course, some pioneering techniques like holography or focal series or ptychography have tried to reconstruct the electron waves functions at the exit surface of the observed objects, but their results and applications were quite limited or, as far as ptychography is concerned, quite rare.  The availabilities of new pixelated 2D-detectors [1] and new algorithms to analyse series of image/diffraction data are now opening a new area of research in TEM: determining the electron waves and the object potentials at different planes of the observed object should become the main objective of quantitative TEM. Applied at an atomic level, this method, which is presently named ptychography, but I would like to generalize as neuscopies should be able to resolve the 3D atomic structure of any piece of matter that is thin and resistant enough to be traversed by an electron beam. Internship will analyse experimental and simulated data with different ‘ptychography’ software and eventually participate in the acquisition of some experimental data.

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