Large scale parametric characterization, variability study and tests of quantum devices at cryogenic temperatures

A natural way to address the scalability of quantum devices is to design and realise arrays of individual quantum objects with nearest-neighbor interaction. In large-scale semiconductor quantum processors, a quantum bit is encoded in the spin of an isolated electron, trapped in an array of quantum dots (QDs) [1]. Over the years, we have studied devices with an increasing number of QDs, in designs that allow for the coherent control of individual spin [2]. To scale up spin qubit devices to computationally useful size, it is necessary to achieve very large-scale standards for quantum dot integration and control. Therefore, demonstrating the extensive and scalable characterization and calibration of QD systems is crucial for the development of our quantum processor. Recently, CEA-Leti has acquired a unique automatised measurement tool for 300-mm wafers at cryogenic temperature, which gives us a new way to develop intelligent and efficient characterization techniques (Figure 1).

[1] Vinet, M. et al. Towards scalable silicon quantum computing, IEDM (2018).

[2] Mortemousque, P.-A. et al. Coherent control of individual electron spins in a two-dimensional quantum dot array. Nat. Nanotechnol. (2020) doi:10.1038/s41565-020-00816-w

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