Actualités :

08 octobre 2019

Optimization of Residual Gas Analysis mass spectrum through machine learning

Context And background : LCFC Lab offers a complete RGA testing solution for outgassing and hermetic studies of microelectronic and MEMS package cavities. Two ultra high vacuum apparatus has been developed as well as a devoted software package for qualitative and quantitative RGA data analysis. To strengthen the RGA activity, software optimization and improvement is […] >>

08 octobre 2019

Innovative 3D Technology of a nonvolatile memory cell for In-Memory-Computing

Context: This internship, performed in the framework of an ambitious European project, aims to provide for the first time a powerful and viable technological solution consisting in processing the information inside or close to the memory circuit block (also known as « In-Memory Computing »). Thanks to this new solution, a new class of nano-technology mixing a […] >>

08 octobre 2019

Développement de mesures dynamiques pour composants GaN sur silicium

Cadre et contexte Les composants de puissance GaN sur Si sont aujourd’hui vu comme la prochaine génération de composants « mass market » pour la conversion d’énergie électrique. Dans ce cadre, le LETI développe sa propre filière GaN sur Si (compatible CMOS) allant du substrat au module final.  Ces dispositifs doivent opérer des commutations entre un état […] >>

08 octobre 2019

Characterization and reliability of RF switches, study of the substrate impact on performance.

Context: Incoming 5G imposes new challenges on RF devices performance such as operating at millimeter-wave frequencies and harsh constraints on linearity to avoid spectral pollution in the adjacent carriers. The best way to efficiently reduce the level of harmonics is to boost the resistivity of the semiconductor beneath the buried oxide. In SOI (Silicon on […] >>

08 octobre 2019

RF Characterization and reliability of a power amplifier cell under large signal operation

Context : In an RF front end module, the power amplifier is the device seeing the harshest conditions with regard to reliability (temperature, voltage). The lifetime prediction of such devices needs appropriate testing and modeling as the current reliability models are solely based on DC measurements. An RF-based model is then mandatory to accurately estimate […] >>
En naviguant sur notre site, vous acceptez que des cookies soient utilisés pour vous proposer des contenus et services adaptés à vos centres d’intérêts. En savoir plus
X