News : MEM

January 01 2023

µLaue diffraction and excited luminescence in nitrides optoelectronics: physics, operando, serial crystallography

The Laue microdiffraction instrument (µLaue), installed at the European Synchrotron (ESRF) in Grenoble (BM32 beamline), is unique in Europe and probes the matter by diffracting a polychromatic X-ray beam of a few hundred nanometers. The acquisition of the Laue diffraction diagram is very fast and allows scanning the samples with high precision to get the […] >>

January 18 2022

Postdoctoral position on the modeling of silicon spin qubits

A post-doctoral position is opened at the Interdisciplinary Research Institute of Grenoble (IRIG) of the CEA Grenoble (France) on the theory and modeling of silicon spin quantum bits (qubits). The selected candidate is expected to start at the beginning of year 2022, for up to two years. Quantum information technologies on silicon have raised an […] >>

October 11 2019

Operando characterization of batteries using synchrotron tomography and neutron imaging techniques

The in situ characterization of battery materials is needed to help designing safer and more efficient electrochemical devices. In particular, following in real-time the lithiation and ageing mechanisms require to use advanced non-destructive tools capable to probe the system during cycling. In this regard, synchrotron and neutron techniques provide unique capabilities to access the chemical, […] >>

October 11 2019

Determining Electron Wave Functions and Object Potentials in Transmission Electron Microscopy: improvement of algorithms

Up to now transmission electron microscopy (TEM) was more focused on producing images or diffraction patterns of objects. Of course, some pioneering techniques like holography or focal series or ptychography have tried to reconstruct the electron waves functions at the exit surface of the observed objects, but their results and applications were quite limited or, […] >>

October 11 2019

Determining Electron Wave Functions and Object Potentials in Transmission Electron Microscopy: application to stacks of 2D materials

Up to now transmission electron microscopy (TEM) was more focused on producing images or diffraction patterns of objects. Of course, some pioneering techniques like holography or focal series or ptychography have tried to reconstruct the electron waves functions at the exit surface of the observed objects, but their results and applications were quite limited or, […] >>
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